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呂柔慧
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呂柔慧
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呂柔慧
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1
Empirical Analysis on Damage Awards and the Burden of Proof in Patent Infringement Litigation
by
Lu, Jou-Hui
,
呂
柔
慧
Published 2017
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2
美國專利懲罰性賠償解析─以2016年聯邦最高法院 Halo Electronics Inc. v. Pulse Electronics Inc.為中心 The Analysis on U.S. Punitive Damages of Patent Infringement: Focusing on Halo Electronics Inc. v. Pulse...
by
呂
柔
慧
Jou-Hui Lu
Published 2017-12-01
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