Growth and applications of GeSn-related group-IV semiconductor materials

by Shigeaki Zaima, Osamu Nakatsuka, Noriyuki Taoka, Masashi Kurosawa, Wakana Takeuchi, Mitsuo Sakashita
Published 2015-07-01

Characterization of Defect Traps in SiO2 Thin Films

by Jean-Yves Rosaye, Pierre Mialhe, Jean-Pierre Charles, Mitsuo Sakashita, Hiroya Ikeda, Akira Sakai, Shigeaki Zaima, Yukio Yasuda
Published 2001-01-01