Modeling Nanoscale FinFET Performance by a Neural Network Method

This paper presents a neural network method to model nanometer FinFET performance. The principle of this method is firstly introduced and its application in modeling DC and conductance characteristics of nanoscale FinFET transistor is demonstrated in detail. It is shown that this method does not nee...

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Bibliographic Details
Main Authors: Jin He, Guoqing Hu, Bing Xie, Guangjin Ma, Ping He, Lei Song, Chunlai Li, Daye Lin, Jingjing Liu, Ying Yu, Zhangyuan Chen, Zhiping Zhou
Format: Article
Language:English
Published: IFSA Publishing, S.L. 2017-07-01
Series:Sensors & Transducers
Subjects:
Online Access:http://www.sensorsportal.com/HTML/DIGEST/july_2017/Vol_214/P_2940.pdf