An efficient reliability estimation method for CNTFET‐based logic circuits
Carbon nanotube field‐effect transistors (CNTFETs) have been widely studied as a promising technology to be included in post‐complementary metal‐oxide‐semiconductor integrated circuits. Despite significant advantages in terms of delay and power dissipation, the fabrication process for CNTFETs is pla...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Electronics and Telecommunications Research Institute (ETRI)
2021-06-01
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| Series: | ETRI Journal |
| Subjects: | |
| Online Access: | https://doi.org/10.4218/etrij.2019-0556 |