Metric Learning Method Aided Data-Driven Design of Fault Detection Systems

Fault detection is fundamental to many industrial applications. With the development of system complexity, the number of sensors is increasing, which makes traditional fault detection methods lose efficiency. Metric learning is an efficient way to build the relationship between feature vectors with...

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Bibliographic Details
Main Authors: Guoyang Yan, Jiangyuan Mei, Shen Yin, Hamid Reza Karimi
Format: Article
Language:English
Published: Hindawi Limited 2014-01-01
Series:Mathematical Problems in Engineering
Online Access:http://dx.doi.org/10.1155/2014/974758
Description
Summary:Fault detection is fundamental to many industrial applications. With the development of system complexity, the number of sensors is increasing, which makes traditional fault detection methods lose efficiency. Metric learning is an efficient way to build the relationship between feature vectors with the categories of instances. In this paper, we firstly propose a metric learning-based fault detection framework in fault detection. Meanwhile, a novel feature extraction method based on wavelet transform is used to obtain the feature vector from detection signals. Experiments on Tennessee Eastman (TE) chemical process datasets demonstrate that the proposed method has a better performance when comparing with existing methods, for example, principal component analysis (PCA) and fisher discriminate analysis (FDA).
ISSN:1024-123X
1563-5147