Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy

Potential Dip in Organic Photovoltaics Probed by Cross-sectional Kelvin Probe Force Microscopy

Abstract Cross-sectional potential distribution of high open-circuit voltage bulk heterojunction photovoltaic device was measured using Kelvin probe force microscopy. Potential drop confined at cathode interface implies that photo-active layer is an effective p-type semiconductor. Potential values i...

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Bibliographic Details
Main Authors: Jongjin Lee, Jaemin Kong
Format: Article
Language:English
Published: SpringerOpen 2018-08-01
Series:Nanoscale Research Letters
Subjects:
BHJ device
Energy band diagram
Kelvin probe force microscopy
Online Access:http://link.springer.com/article/10.1186/s11671-018-2639-6

Internet

http://link.springer.com/article/10.1186/s11671-018-2639-6

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