Optical Properties and Surface Morphology of Zinc Telluride Thin Films Prepared by Stacked Elemental Layer Method
ZnTe thin films were prepared by Stacking of elemental (Zn and Te) layers (SEL) followed by inert gas annealing. The optical parameters were calculated from the transmission spectra. The bandgap of the annealed samples was found between 1.95 eV and 2.06 eV. The change in film thickness after anneali...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Kaunas University of Technology
2012-06-01
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Series: | Medžiagotyra |
Subjects: | |
Online Access: | http://matsc.ktu.lt/index.php/MatSc/article/view/1908 |