Optical Properties and Surface Morphology of Zinc Telluride Thin Films Prepared by Stacked Elemental Layer Method

ZnTe thin films were prepared by Stacking of elemental (Zn and Te) layers (SEL) followed by inert gas annealing. The optical parameters were calculated from the transmission spectra. The bandgap of the annealed samples was found between 1.95 eV and 2.06 eV. The change in film thickness after anneali...

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Bibliographic Details
Main Authors: Subramani SHANMUGAN, Devarajan MUTHARASU
Format: Article
Language:English
Published: Kaunas University of Technology 2012-06-01
Series:Medžiagotyra
Subjects:
Online Access:http://matsc.ktu.lt/index.php/MatSc/article/view/1908