Towards phasing using high X-ray intensity

Towards phasing using high X-ray intensity

X-ray free-electron lasers (XFELs) show great promise for macromolecular structure determination from sub-micrometre-sized crystals, using the emerging method of serial femtosecond crystallography. The extreme brightness of the XFEL radiation can multiply ionize most, if not all, atoms in a protein,...

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Bibliographic Details
Main Authors: Lorenzo Galli, Sang-Kil Son, Thomas R. M. Barends, Thomas A. White, Anton Barty, Sabine Botha, Sébastien Boutet, Carl Caleman, R. Bruce Doak, Max H. Nanao, Karol Nass, Robert L. Shoeman, Nicusor Timneanu, Robin Santra, Ilme Schlichting, Henry N. Chapman
Format: Article
Language:English
Published: International Union of Crystallography 2015-11-01
Series:IUCrJ
Subjects:
serial femtosecond crystallography
high-intensity phasing
radiation damage
electronic damage
X-ray free-electron lasers
high XFEL doses
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252515014049

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http://scripts.iucr.org/cgi-bin/paper?S2052252515014049

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