Aberration correction for low voltage optimized transmission electron microscopy
Further development of low voltage electron microscopy leads to an aberration correction of the device in order to improve its spatial resolution. The integration of a corrector to a desktop transmission electron microscope with exclusively low-voltage design seems to be a challenging task. The bene...
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| Format: | Article |
| Language: | English |
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Elsevier
2018-01-01
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| Series: | MethodsX |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2215016118301377 |