Analyses of Substrate-Dependent Broadband Microwave (1–40 GHz) Dielectric Properties of Pulsed Laser Deposited Ba<sub>0.5</sub>Sr<sub>0.5</sub>TiO<sub>3</sub> Films

Analyses of Substrate-Dependent Broadband Microwave (1–40 GHz) Dielectric Properties of Pulsed Laser Deposited Ba<sub>0.5</sub>Sr<sub>0.5</sub>TiO<sub>3</sub> Films

Ba<sub>0.5</sub>Sr<sub>0.5</sub>TiO<sub>3</sub> (BST-0.5) thin films (600 nm) were deposited on single crystal MgO, SrTiO<sub>3</sub> (STO), and LaAlO<sub>3</sub> (LAO) substrates by pulsed laser deposition at an oxygen partial pressure of...

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Bibliographic Details
Main Authors: Sandwip K. Dey, Sudheendran Kooriyattil, Shojan P. Pavunny, Ram S. Katiyar, Guru Subramanyam
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Crystals
Subjects:
dielectric permittivity
loss tangent
epitaxial BST thin films
microwave characterization
homogeneous in-plane strain engineering
inhomogeneous strain
Online Access:https://www.mdpi.com/2073-4352/11/8/852

Internet

https://www.mdpi.com/2073-4352/11/8/852

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