Si Nanocrystals Embedded in a Silicon Oxynitride Matrix
We investigated the morphological and structural change in silicon nanostructures embedded in the silicon oxynitride matrix. The study has been carried out on thin films thermally annealed at high temperature, after deposition at 400°C by Electron Cyclotron Resonance Plasma Enhanced Chemical...
Main Authors: | , , , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
SAGE Publishing
2011-10-01
|
Series: | Nanomaterials and Nanotechnology |
Subjects: | |
Online Access: | http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/si_nanocrystals_embedded_in_a_silicon_oxynitride_matrix |