Si Nanocrystals Embedded in a Silicon Oxynitride Matrix

We investigated the morphological and structural change in silicon nanostructures embedded in the silicon oxynitride matrix. The study has been carried out on thin films thermally annealed at high temperature, after deposition at 400°C by Electron Cyclotron Resonance Plasma Enhanced Chemical...

Full description

Bibliographic Details
Main Authors: Abdelillah Slaoui, Marzia Carrada, Gérald Ferblantier, Lorenzo Morresi, Nicola Pinto, Marco Ficcadenti
Format: Article
Language:English
Published: SAGE Publishing 2011-10-01
Series:Nanomaterials and Nanotechnology
Subjects:
Online Access:http://www.intechopen.com/journals/nanomaterials_and_nanotechnology/si_nanocrystals_embedded_in_a_silicon_oxynitride_matrix