Development of an Evaluation Platform for Statistical Characterization of MOSFET Model Parameters
In discrete electronics, the statistical variability of device parameters is seldom given in datasheets, at least in such a way that this information can still be useful at design phase. Furthermore, even though several device manufacturers provide simulation models for simulation tools, the device-...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Universidade do Porto
2017-06-01
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| Series: | U.Porto Journal of Engineering |
| Subjects: | |
| Online Access: | https://journalengineering.fe.up.pt/article/view/79 |