Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays

Silicon nanowire field-effect transistors (SiNW-FET) have been studied as ultra-high sensitive sensors for the detection of biomolecules, metal ions, gas molecules and as an interface for biological systems due to their remarkable electronic properties. “Bottom-up” or “top-down” approaches that are...

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Main Authors: Marcel Tintelott, Vivek Pachauri, Sven Ingebrandt, Xuan Thang Vu
Format: Article
Language:English
Published: MDPI AG 2021-07-01
Series:Sensors
Subjects:
Online Access:https://www.mdpi.com/1424-8220/21/15/5153
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spelling doaj-76a740055c294bdbb48718004b232f502021-08-06T15:31:36ZengMDPI AGSensors1424-82202021-07-01215153515310.3390/s21155153Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor ArraysMarcel Tintelott0Vivek Pachauri1Sven Ingebrandt2Xuan Thang Vu3Institute of Materials in Electrical Engineering 1, RWTH Aachen University, Sommerfeldstr. 24, 52074 Aachen, GermanyInstitute of Materials in Electrical Engineering 1, RWTH Aachen University, Sommerfeldstr. 24, 52074 Aachen, GermanyInstitute of Materials in Electrical Engineering 1, RWTH Aachen University, Sommerfeldstr. 24, 52074 Aachen, GermanyInstitute of Materials in Electrical Engineering 1, RWTH Aachen University, Sommerfeldstr. 24, 52074 Aachen, GermanySilicon nanowire field-effect transistors (SiNW-FET) have been studied as ultra-high sensitive sensors for the detection of biomolecules, metal ions, gas molecules and as an interface for biological systems due to their remarkable electronic properties. “Bottom-up” or “top-down” approaches that are used for the fabrication of SiNW-FET sensors have their respective limitations in terms of technology development. The “bottom-up” approach allows the synthesis of silicon nanowires (SiNW) in the range from a few nm to hundreds of nm in diameter. However, it is technologically challenging to realize reproducible bottom-up devices on a large scale for clinical biosensing applications. The top-down approach involves state-of-the-art lithography and nanofabrication techniques to cast SiNW down to a few 10s of nanometers in diameter out of high-quality Silicon-on-Insulator (SOI) wafers in a controlled environment, enabling the large-scale fabrication of sensors for a myriad of applications. The possibility of their wafer-scale integration in standard semiconductor processes makes SiNW-FETs one of the most promising candidates for the next generation of biosensor platforms for applications in healthcare and medicine. Although advanced fabrication techniques are employed for fabricating SiNW, the sensor-to-sensor variation in the fabrication processes is one of the limiting factors for a large-scale production towards commercial applications. To provide a detailed overview of the technical aspects responsible for this sensor-to-sensor variation, we critically review and discuss the fundamental aspects that could lead to such a sensor-to-sensor variation, focusing on fabrication parameters and processes described in the state-of-the-art literature. Furthermore, we discuss the impact of functionalization aspects, surface modification, and system integration of the SiNW-FET biosensors on post-fabrication-induced sensor-to-sensor variations for biosensing experiments.https://www.mdpi.com/1424-8220/21/15/5153silicon nanowire field-effect transistordevice-to-device variationbiosensortop-down fabricationsurface modification
collection DOAJ
language English
format Article
sources DOAJ
author Marcel Tintelott
Vivek Pachauri
Sven Ingebrandt
Xuan Thang Vu
spellingShingle Marcel Tintelott
Vivek Pachauri
Sven Ingebrandt
Xuan Thang Vu
Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays
Sensors
silicon nanowire field-effect transistor
device-to-device variation
biosensor
top-down fabrication
surface modification
author_facet Marcel Tintelott
Vivek Pachauri
Sven Ingebrandt
Xuan Thang Vu
author_sort Marcel Tintelott
title Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays
title_short Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays
title_full Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays
title_fullStr Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays
title_full_unstemmed Process Variability in Top-Down Fabrication of Silicon Nanowire-Based Biosensor Arrays
title_sort process variability in top-down fabrication of silicon nanowire-based biosensor arrays
publisher MDPI AG
series Sensors
issn 1424-8220
publishDate 2021-07-01
description Silicon nanowire field-effect transistors (SiNW-FET) have been studied as ultra-high sensitive sensors for the detection of biomolecules, metal ions, gas molecules and as an interface for biological systems due to their remarkable electronic properties. “Bottom-up” or “top-down” approaches that are used for the fabrication of SiNW-FET sensors have their respective limitations in terms of technology development. The “bottom-up” approach allows the synthesis of silicon nanowires (SiNW) in the range from a few nm to hundreds of nm in diameter. However, it is technologically challenging to realize reproducible bottom-up devices on a large scale for clinical biosensing applications. The top-down approach involves state-of-the-art lithography and nanofabrication techniques to cast SiNW down to a few 10s of nanometers in diameter out of high-quality Silicon-on-Insulator (SOI) wafers in a controlled environment, enabling the large-scale fabrication of sensors for a myriad of applications. The possibility of their wafer-scale integration in standard semiconductor processes makes SiNW-FETs one of the most promising candidates for the next generation of biosensor platforms for applications in healthcare and medicine. Although advanced fabrication techniques are employed for fabricating SiNW, the sensor-to-sensor variation in the fabrication processes is one of the limiting factors for a large-scale production towards commercial applications. To provide a detailed overview of the technical aspects responsible for this sensor-to-sensor variation, we critically review and discuss the fundamental aspects that could lead to such a sensor-to-sensor variation, focusing on fabrication parameters and processes described in the state-of-the-art literature. Furthermore, we discuss the impact of functionalization aspects, surface modification, and system integration of the SiNW-FET biosensors on post-fabrication-induced sensor-to-sensor variations for biosensing experiments.
topic silicon nanowire field-effect transistor
device-to-device variation
biosensor
top-down fabrication
surface modification
url https://www.mdpi.com/1424-8220/21/15/5153
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AT sveningebrandt processvariabilityintopdownfabricationofsiliconnanowirebasedbiosensorarrays
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