Electrical and optical properties of CZTS thin films prepared by SILAR method
In the present work, Cu2ZnSnS4 (CZTS) thin film was deposited onto the glass substrate by simple and economic SILAR method and its structural, morphological, optical and electrical properties were analyzed. X-ray diffraction (XRD) analysis confirms the formation of CZTS with kesterite structure and...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Taylor & Francis Group
2016-03-01
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| Series: | Journal of Asian Ceramic Societies |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2187076415300245 |