Nanostructural Characterisation and Optical Properties of Sputter-Deposited Thick Indium Tin Oxide (ITO) Coatings

• Main Authors: Andrius Subacius, Bill Baloukas, Etienne Bousser, Steve J. Hinder, Mark A. Baker, Claus Rebholz, Allan Matthews
• Format: Article
• Language: English
• Published: MDPI AG 2020-11-01
• Series: Coatings
• Subjects: indium tin oxide; ITO; coatings; magnetron sputtering; thickness; structure
• Online Access: https://www.mdpi.com/2079-6412/10/11/1127

Indium tin oxide (ITO) thin films, used in many optoelectronic applications, are typically grown to a thickness of a maximum of a few hundred nanometres. In this work, the composition, microstructure and optical/electrical properties of thick ITO coatings deposited by radio frequency magnetron sputtering from a ceramic ITO target in an Ar/O₂ gas mixture (total O₂ flow of 1%) on unheated glass substrates are reported for the first time. In contrast to the commonly observed (200) or (400) preferential orientations in ITO thin films, the approximately 3.3 μm thick coatings display a (622) preferential orientation. The ITO coatings exhibit a purely nanocrystalline structure and show good electrical and optical properties, such as an electrical resistivity of 1.3 × 10⁻¹ Ω·cm, optical transmittance at 550 nm of ~60% and optical band gap of 2.9 eV. The initial results presented here are expected to provide useful information for future studies on the synthesis of high-quality thick ITO coatings.