Numerical Verification of Dielectric Contactor as Auxiliary Loads for Measuring the Multi-Port Network Parameter of Vertical Interconnection Array
For the accurate and reliable multi-port characterization of vertical interconnection array structures, this paper presents an indirect-contact probing method to obtain network parameters of N-port device-under-tests (DUTs) using an M-port (N > M) vector network analyzer (VNA) with a dielectr...
Main Authors: | Byungjin Bae, Jingook Kim, Ki Jin Han |
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Format: | Article |
Language: | English |
Published: |
IEEE
2020-01-01
|
Series: | IEEE Access |
Subjects: | |
Online Access: | https://ieeexplore.ieee.org/document/9119390/ |
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