Methods for reducing write error rate in voltage-induced switching having prolonged tolerance of voltage-pulse duration
Simulating the magnetization dynamics in a perpendicularly-magnetized free layer with Langevin equation, we investigated methods for reducing write error rate (WER) in voltage-induced switching with long tolerance of voltage-pulse duration (tp). The simulation results show that WER can be reduced by...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2019-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5128154 |