Nano-Electrochemistry and Nano-Electrografting with an Original Combined AFM-SECM

Nano-Electrochemistry and Nano-Electrografting with an Original Combined AFM-SECM

This study demonstrates the advantages of the combination between atomic force microscopy and scanning electrochemical microscopy. The combined technique can perform nano-electrochemical measurements onto agarose surface and nano-electrografting of non-conducting polymers onto conducting surfaces. T...

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Bibliographic Details
Main Authors: Ammar Ben Brahim, Cédric Goyer, Christophe Demaille, Serge Palacin, Julienne Charlier, Federico Grisotto, Achraf Ghorbal
Format: Article
Language:English
Published: MDPI AG 2013-05-01
Series:Nanomaterials
Subjects:
AFM
SECM
nano-electrochemistry
nano-electrografting
AFM-SECM
surface
interface
nano-functionalization
nano-process
Online Access:http://www.mdpi.com/2079-4991/3/2/303

Internet

http://www.mdpi.com/2079-4991/3/2/303

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