Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics

We report the impact of carbon nanotube (CNT) buried layer in the middle of 7 μm polyimide (PI) substrate on the electrical performance of amorphous-indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) by repetitive mechanical stretching. TFT arrays on 3 mm × 3 mm PI...

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Main Authors: Md Mehedi Hasan, Mohammad Masum Billah, Xiuling Li, Jin Jang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8733897/
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spelling doaj-a0ffccc94b2d4153b2cc3881fb22edb02021-04-05T16:57:40ZengIEEEIEEE Journal of the Electron Devices Society2168-67342019-01-01780180710.1109/JEDS.2019.29210188733897Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable ElectronicsMd Mehedi Hasan0https://orcid.org/0000-0001-9030-8209Mohammad Masum Billah1https://orcid.org/0000-0001-7895-5948Xiuling Li2https://orcid.org/0000-0003-4600-2362Jin Jang3https://orcid.org/0000-0002-7572-5669Department of Information Display, Advanced Display Research Center, Kyung Hee University, Seoul, South KoreaDepartment of Information Display, Advanced Display Research Center, Kyung Hee University, Seoul, South KoreaDepartment of Information Display, Advanced Display Research Center, Kyung Hee University, Seoul, South KoreaDepartment of Information Display, Advanced Display Research Center, Kyung Hee University, Seoul, South KoreaWe report the impact of carbon nanotube (CNT) buried layer in the middle of 7 &#x03BC;m polyimide (PI) substrate on the electrical performance of amorphous-indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) by repetitive mechanical stretching. TFT arrays on 3 mm &#x00D7; 3 mm PI layers were attached on 40 &#x03BC;m polydimethylsiloxane (PDMS) substrate by double-sided PI tape. A negative threshold voltage shift (&#x0394;V<sub>Th</sub>(V)) of -3 V has been found under 70% mechanical stretching for the TFTs on the conventional PI substrate, whereas the TFTs with CNT layer inside PI substrate exhibited robust TFT performance. The fabricated oxide TFTs reported here with CNT inside PI substrate shows field effect mobility (&#x03BC;<sub>FE</sub>) ~ 14 cm<sup>2</sup>/V&#x00B7;s at pristine state, and changed &lt;;5% after repetitive mechanical stretching and bending which might be attributed from the strain absorbing CNT layer inside PI substrate using TCAD simulation.https://ieeexplore.ieee.org/document/8733897/<italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">a</italic>-IGZO TFTsburied layerstretchingtensile bendingPI substrateTCAD
collection DOAJ
language English
format Article
sources DOAJ
author Md Mehedi Hasan
Mohammad Masum Billah
Xiuling Li
Jin Jang
spellingShingle Md Mehedi Hasan
Mohammad Masum Billah
Xiuling Li
Jin Jang
Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics
IEEE Journal of the Electron Devices Society
<italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">a</italic>-IGZO TFTs
buried layer
stretching
tensile bending
PI substrate
TCAD
author_facet Md Mehedi Hasan
Mohammad Masum Billah
Xiuling Li
Jin Jang
author_sort Md Mehedi Hasan
title Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics
title_short Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics
title_full Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics
title_fullStr Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics
title_full_unstemmed Robust Oxide Thin-Film Transistors With Embedded CNT Buried Layer for Stretchable Electronics
title_sort robust oxide thin-film transistors with embedded cnt buried layer for stretchable electronics
publisher IEEE
series IEEE Journal of the Electron Devices Society
issn 2168-6734
publishDate 2019-01-01
description We report the impact of carbon nanotube (CNT) buried layer in the middle of 7 &#x03BC;m polyimide (PI) substrate on the electrical performance of amorphous-indium-gallium-zinc-oxide (a-IGZO) thin-film transistors (TFTs) by repetitive mechanical stretching. TFT arrays on 3 mm &#x00D7; 3 mm PI layers were attached on 40 &#x03BC;m polydimethylsiloxane (PDMS) substrate by double-sided PI tape. A negative threshold voltage shift (&#x0394;V<sub>Th</sub>(V)) of -3 V has been found under 70% mechanical stretching for the TFTs on the conventional PI substrate, whereas the TFTs with CNT layer inside PI substrate exhibited robust TFT performance. The fabricated oxide TFTs reported here with CNT inside PI substrate shows field effect mobility (&#x03BC;<sub>FE</sub>) ~ 14 cm<sup>2</sup>/V&#x00B7;s at pristine state, and changed &lt;;5% after repetitive mechanical stretching and bending which might be attributed from the strain absorbing CNT layer inside PI substrate using TCAD simulation.
topic <italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">a</italic>-IGZO TFTs
buried layer
stretching
tensile bending
PI substrate
TCAD
url https://ieeexplore.ieee.org/document/8733897/
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AT mohammadmasumbillah robustoxidethinfilmtransistorswithembeddedcntburiedlayerforstretchableelectronics
AT xiulingli robustoxidethinfilmtransistorswithembeddedcntburiedlayerforstretchableelectronics
AT jinjang robustoxidethinfilmtransistorswithembeddedcntburiedlayerforstretchableelectronics
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