Single event effects qualificatoin of integrated circuits
The goal of qualification or monitoring of electronic device radiation testings is to ensure that devices meet the set of requirements. In some cases, this can be achieved without full characterization of radiation behavior, which leads to significant cost reduction of radiation testing. In this pap...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Moscow Engineering Physics Institute
2020-03-01
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| Series: | Bezopasnostʹ Informacionnyh Tehnologij |
| Subjects: | |
| Online Access: | https://bit.mephi.ru/index.php/bit/article/view/1253 |