Research Update: Spatially resolved mapping of electronic structure on atomic level by multivariate statistical analysis
Atomic level spatial variability of electronic structure in Fe-based superconductor FeTe0.55Se0.45 (Tc = 15 K) is explored using current-imaging tunneling-spectroscopy. Multivariate statistical analysis of the data differentiates regions of dissimilar electronic behavior that can be ide...
Main Authors: | , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
AIP Publishing LLC
2014-12-01
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Series: | APL Materials |
Online Access: | http://dx.doi.org/10.1063/1.4902996 |