Serial snapshot crystallography for materials science with SwissFEL

Serial snapshot crystallography for materials science with SwissFEL

New opportunities for studying (sub)microcrystalline materials with small unit cells, both organic and inorganic, will open up when the X-ray free electron laser (XFEL) presently being constructed in Switzerland (SwissFEL) comes online in 2017. Our synchrotron-based experiments mimicking the 4%-ener...

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Bibliographic Details
Main Authors: Catherine Dejoie, Stef Smeets, Christian Baerlocher, Nobumichi Tamura, Philip Pattison, Rafael Abela, Lynne B. McCusker
Format: Article
Language:English
Published: International Union of Crystallography 2015-05-01
Series:IUCrJ
Subjects:
serial snapshot crystallography
multi-microcrystal diffraction
indexing
broad-bandpass beam
XFEL
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252515006740

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