Massively parallel fabrication of crack-defined gold break junctions featuring sub-3 nm gaps for molecular devices

The field of molecular electronics is currently held back by the lack of scalability and reproducibility of existing break junction technologies. Here, Dubois et al. demonstrate parallel fabrication of millions of gold break junctions with sub-3 nm gaps via controllable crack formation on a wafer sc...

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Bibliographic Details
Main Authors: Valentin Dubois, Shyamprasad N. Raja, Pascal Gehring, Sabina Caneva, Herre S. J. van der Zant, Frank Niklaus, Göran Stemme
Format: Article
Published: Nature Publishing Group 2018-08-01
Series:Nature Communications
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