Design of Nonbinary Error Correction Codes With a Maximum Run-Length Constraint to Correct a Single Insertion or Deletion Error for DNA Storage
Due to the advantages of high information densities and longevity, DNA storage systems have begun to attract a lot of attention. However, common obstacles to DNA storage are caused by insertion, deletion, and substitution errors occurring in DNA synthesis and sequencing. In this paper, we first expl...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9552003/ |