In situ synchrotron X-ray diffraction study of the electrochemical reduction of SiO2 in molten CaCl2

In situ synchrotron X-ray diffraction study of the electrochemical reduction of SiO2 in molten CaCl2

In situ synchrotron X-ray diffraction was used to investigate the electrochemical reduction of SiO2 to Si in molten CaCl2 at 1123 K for the first time. The present technique enabled direct determination of intermediate products at high temperature, without cooling and washing treatments. Based on th...

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Bibliographic Details
Main Authors: Yumi Katasho, Yutaro Norikawa, Takayuki Yamamoto, Kouji Yasuda, Toshiyuki Nohira
Format: Article
Language:English
Published: Elsevier 2020-06-01
Series:Electrochemistry Communications
Subjects:
Molten salt
In situ analysis
Energy-dispersive X-ray diffraction
SiO2
Electrochemical reduction
CaCl2
Online Access:http://www.sciencedirect.com/science/article/pii/S1388248120300916

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http://www.sciencedirect.com/science/article/pii/S1388248120300916

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