Real time drift measurement for colloidal probe atomic force microscope: a visual sensing approach
Drift has long been an issue in atomic force microscope (AFM) systems and limits their ability to make long time period measurements. In this study, a new method is proposed to directly measure and compensate for the drift between AFM cantilevers and sample surfaces in AFM systems. This was achieved...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2014-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4880242 |