EBSCN: An Error Backtracking Method for Soft Errors Based on Clustering and a Neural Network

With the development of integrated circuit design technology, soft errors have become an important threat to system reliability, and software-based fault-tolerant techniques are gradually attracting people's attention. In many cases, researchers use fault injection techniques that are less obse...

Full description

Bibliographic Details
Main Authors: Nan Zhang, Jianjun Xu, Xiankai Meng, Qingping Tan
Format: Article
Published: IEEE 2019-01-01
Series:IEEE Access
Online Access:https://ieeexplore.ieee.org/document/8865113/