EBSCN: An Error Backtracking Method for Soft Errors Based on Clustering and a Neural Network
With the development of integrated circuit design technology, soft errors have become an important threat to system reliability, and software-based fault-tolerant techniques are gradually attracting people's attention. In many cases, researchers use fault injection techniques that are less obse...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
|
| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8865113/ |