A platform design of single event effect mitigation for SRAM-based FPGA

A platform design of single event effect mitigation for SRAM-based FPGA

Be aimed at application requirements of VLSI(very large scale integration) in space environment, current researching status in China and abroad of radiation harden of FPGA are introduced in the paper. With a simple description of space radiation environment and SEE(single event effect) and analyzing...

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Bibliographic Details
Main Authors:	Qi Liuyu, Liu Guodong, Zhao Zhengyang
Format:	Article
Language:	zho
Published:	National Computer System Engineering Research Institute of China 2019-05-01
Series:	Dianzi Jishu Yingyong
Subjects:	single event effect Kintex-7 FPGA radiation harden design scrubbing test
Online Access:	http://www.chinaaet.com/article/3000101622

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