Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters
Increase in manufacturing test cost is of paramount issue to chip suppliers, which has been primarily due to costly external testers and long test-time. This paper proposes a loopback-based self-test technique to cost-effectively predict the dynamic nonlinearities of on-chip segmented digital-to-ana...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8951107/ |