Depth Analysis for Sensitivity Pattern Section in the Electrical Resistivity using the 2D Computerized Modeling Method
This paper presents the analysis of depth of investigation factors which are (Zm/a) and (Zm/L). The medium depth of investigation (Zm) from the sensitivity pattern of different arrays influences the array selection which is good enough for planning infield surveys. In this paper, the average maximum...
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| Format: | Article |
| Language: | English |
| Published: |
Mete Oner,
2014.
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| Online Access: | Get fulltext |