Electrical conductivity measurements in evaporated tin sulphide thin films

Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...

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Bibliographic Details
Main Authors: Deraman, Karim (Author), Sakrani, Samsudi (Author), Ismail, B. B. (Author), Wahab, Yusof (Author), Gould, R. D. (Author)
Format: Article
Published: Taylor & Francis, 1994.
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