Electrical conductivity measurements in evaporated tin sulphide thin films
Tin sulphide (SnS) has been evaporated on to substrates maintained at fixed temperature in the range 50-300 oC. X-ray diffraction measurements have shown that the films deposited at the lower substrate temperatures are non-stoichiometric, containing higher sulphides of tin, but that those deposited...
Main Authors: | Deraman, Karim (Author), Sakrani, Samsudi (Author), Ismail, B. B. (Author), Wahab, Yusof (Author), Gould, R. D. (Author) |
---|---|
Format: | Article |
Language: | English |
Published: |
Taylor & Francis,
1994.
|
Subjects: | |
Online Access: | Get fulltext |
Similar Items
-
Optical absorption in annealed tin sulphide thin films
by: Sakrani, Samsudi, et al.
Published: (1994) -
Study on A.C properties of tin selenidethin films
by: Sakrani, Samsudi, et al.
Published: (2008) -
Synthesis and characterization of thermally evaporated copper bismuth sulphide thin films
by: Hussain, Arshad, et al.
Published: (2017) -
Optical properties of tin-antimony-selenium based amorphous thin films
by: A. Hasbi, Hasbullah, et al.
Published: (2005) -
SnS thin films prepared by encapsulated sulfurization
by: Sakrani, Samsudi, et al.
Published: (1996)