Modelling of nanoscale MOSFET performance in the velocity saturation region
Velocity saturation as a function of temperature and drain voltage for n-channel MOSFET is investigated. The combination of an existing current-voltage (I-V) model, drain source resistance model and a more precise mobility derivation gives an accurate representation of velocity saturation as a funct...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Faculty of Electrical Engineering,
2007.
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Subjects: | |
Online Access: | Get fulltext Get fulltext |