Modelling of nanoscale MOSFET performance in the velocity saturation region

Velocity saturation as a function of temperature and drain voltage for n-channel MOSFET is investigated. The combination of an existing current-voltage (I-V) model, drain source resistance model and a more precise mobility derivation gives an accurate representation of velocity saturation as a funct...

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Bibliographic Details
Main Authors: Tan, Micheal Loong Peng (Author), Ismail, Razali (Author)
Format: Article
Language:English
Published: Faculty of Electrical Engineering, 2007.
Subjects:
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