Off-line quality control by robust parameter design

Master of Science === Department of Statistics === Shie-Shien Yang === There have been considerable debates over the robust parameter design. As a result, there have been many approaches presented that are suited to the robust parameter design. In my report, I illustrate and present Taguchi's r...

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Main Author: Min, Jun Young
Language:en_US
Published: Kansas State University 2008
Subjects:
Online Access:http://hdl.handle.net/2097/597
id ndltd-KSU-oai-krex.k-state.edu-2097-597
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spelling ndltd-KSU-oai-krex.k-state.edu-2097-5972017-08-16T15:44:32Z Off-line quality control by robust parameter design Min, Jun Young Robust Taguchi response semi-parameter Statistics (0463) Master of Science Department of Statistics Shie-Shien Yang There have been considerable debates over the robust parameter design. As a result, there have been many approaches presented that are suited to the robust parameter design. In my report, I illustrate and present Taguchi's robust parameter design, response surface approach and semi-parameter design. Considerable attention has been placed on the semi-parameter design. This approach is new technology that was introduced to Picke, Robinson, Birch and Anderson-Cook (2006). The method is a combined parametric and nonparametric technique to improve the estimates of both the mean and the variance of the response. 2008-04-08T19:06:55Z 2008-04-08T19:06:55Z 2008-04-08T19:06:55Z 2008 May Report http://hdl.handle.net/2097/597 en_US Kansas State University
collection NDLTD
language en_US
sources NDLTD
topic Robust
Taguchi
response
semi-parameter
Statistics (0463)
spellingShingle Robust
Taguchi
response
semi-parameter
Statistics (0463)
Min, Jun Young
Off-line quality control by robust parameter design
description Master of Science === Department of Statistics === Shie-Shien Yang === There have been considerable debates over the robust parameter design. As a result, there have been many approaches presented that are suited to the robust parameter design. In my report, I illustrate and present Taguchi's robust parameter design, response surface approach and semi-parameter design. Considerable attention has been placed on the semi-parameter design. This approach is new technology that was introduced to Picke, Robinson, Birch and Anderson-Cook (2006). The method is a combined parametric and nonparametric technique to improve the estimates of both the mean and the variance of the response.
author Min, Jun Young
author_facet Min, Jun Young
author_sort Min, Jun Young
title Off-line quality control by robust parameter design
title_short Off-line quality control by robust parameter design
title_full Off-line quality control by robust parameter design
title_fullStr Off-line quality control by robust parameter design
title_full_unstemmed Off-line quality control by robust parameter design
title_sort off-line quality control by robust parameter design
publisher Kansas State University
publishDate 2008
url http://hdl.handle.net/2097/597
work_keys_str_mv AT minjunyoung offlinequalitycontrolbyrobustparameterdesign
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