Design and Fabrication of a Nanocantilever for High-Speed Force Microscopy
The atomic force microscope (AFM) has become an important tool in many fields ranging from materials science to biology. The central component of the AFM is a probe consisting of a soft cantilever to which a sharp tip is attached. By scanning the probe over the surface of a sample and measuring sm...
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| Format: | Others |
| Language: | en en |
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2009
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| Online Access: | http://hdl.handle.net/1974/1685 |