Analysis & design of built-in self-testing for random access memories

碩士 === 國立臺灣大學 === 電機工程研究所 === 79 ===

Bibliographic Details
Main Authors: HUANG,ZHONG-MENG, 黃仲盟
Other Authors: LAI,FEI-XIONG
Format: Others
Language:zh-TW
Published: 1991
Online Access:http://ndltd.ncl.edu.tw/handle/35518186209839369645