GANPT: A Circuit for Benchmarking the Methodology of Scan-Based Design for Testability
碩士 === 中華大學 === 電機工程研究所 === 85 === Scan-based design-for-testability (DFT) is one of effective methods to ease the burden both for tests generated during design and applied during manufacturing processes. While applying the scan-based DFT techniques, several problems including inconsistent setting/...
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| Format: | Others |
| Language: | en_US |
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1997
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| Online Access: | http://ndltd.ncl.edu.tw/handle/92805991407680538381 |