The azimuthal alignment and application of the Photoelastic Modulation Ellipsometry

碩士 === 國立交通大學 === 光電工程所 === 87 === Other than nulling method, we propose a three-intensity-measurement technique to determine the azimuth deviation of polarizer (P), photoeiastic modulator(PEM) and analyzer(A) to the surface of incidence. We first used a straight-through set-up to align the relativ...

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Bibliographic Details
Main Authors: Shing Liu, 劉行
Other Authors: Yu-Faye Chao
Format: Others
Language:zh-TW
Published: 1999
Online Access:http://ndltd.ncl.edu.tw/handle/87192056884122658785