WMG:A Wafer Map Generator by Disseminating Defect Patterns
碩士 === 中華大學 === 電機工程學系碩士班 === 88 === In this thesis, we analyze defect patterns on a Wafer Map by the way of disintegrating polyominoes patterns. After disintegrating, these ones can be recorded by different coefficients. According to the values, random disseminating polyonimoes patterns to another...
Main Author: | 黃美瑄 |
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Other Authors: | Jwu E Chen |
Format: | Others |
Language: | zh-TW |
Published: |
2000
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Online Access: | http://ndltd.ncl.edu.tw/handle/02239502131493825842 |
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