The Effect of Ar Plasma Damage on AlGaAs/GaAs Heterojunction Bipolar Transistors

碩士 === 逢甲大學 === 化學工程學系 === 89 === In this study, we used Ar plasma from ICP system to treat AlGaAs/GaAs heterojunction bipolar transistors (HBT). The plasma damage was characterized by evaluating device current gain and base-collector reverse breakdown voltageas as function of RF power、ICP source po...

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Bibliographic Details
Main Authors: Chiang chen-yi, 江振毅
Other Authors: Chien-Hsing Hsu
Format: Others
Language:zh-TW
Published: 2001
Online Access:http://ndltd.ncl.edu.tw/handle/98574372770963651820