MTIF: The Memory Testing Innovation Framework
博士 === 國立清華大學 === 電機工程學系 === 89 === Memories, the basic components of digital systems, are becoming the dominant factor of the area and manufacturing yield of a system chip. The size and density of semiconductor memories is rapidly growing, making them increasingly...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2001
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| Online Access: | http://ndltd.ncl.edu.tw/handle/48101633579800968727 |