The Reflection Z-scan of Bi Thin Film
碩士 === 國立臺灣大學 === 物理學研究所 === 90 === Abstract Bi films were grown onto Corning 7059 Glass by pulsed laser deposition (PLD). And we measure the refractive indices and the thickness of the films by Spectrocscopic Ellipsometry and X-ray reflectivity, respectiv...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2002
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67103668914834550549 |