High-Speed Trace Design for Memory Probing Applications
碩士 === 國立成功大學 === 微電子工程研究所碩博士班 === 91 === Presently, the clock rate of memory has gotten higher, for instance, that of DDR400 has reached 200MHz. As a result, all the companies that manufacture probe cards of wafer tests have made efforts to design new products which can be tasted under high speed a...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2003
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| Online Access: | http://ndltd.ncl.edu.tw/handle/26806921101420819302 |