The study of silicide on Si/Si1-XGeX interface

碩士 === 國立中央大學 === 電機工程研究所 === 92 === In this thesis, the focus is how to fabricate silicide with low resistance and smooth interface. The experimental results promise the potential of MOSFET application. First, we describe the common silicide about advantages and faults. In Ti-silicide, we use und...

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Bibliographic Details
Main Authors: Yong-Xiang Lin, 林詠祥
Other Authors: Pei-Wen Li
Format: Others
Language:zh-TW
Published: 2004
Online Access:http://ndltd.ncl.edu.tw/handle/27389976900784189946