Virtual Metrology Technique for Semiconductor Manufacturing

碩士 === 中原大學 === 機械工程研究所 === 94 === Abstract The semiconductor of our country regards manufacturing as the subject. Under global keen competition, strict process control already become the indispensable demand. It is most important factor of international competitiveness for Panel factory and Liquid...

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Bibliographic Details
Main Authors: Tin-Wei Shen, 沈庭偉
Other Authors: yao-ren zhang
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/31435490116798171493