Application of Reactively Sputtered Zr-Based Binary and Ternary Thin Films to Copper Metallization Process

碩士 === 逢甲大學 === 產業研發碩士班 === 94 === The research uses reactive sputtering to deposit ultra thin (10 nm) ZrN and ZrTiN thin films on silicon wafers (and thermally oxidized SiO2) in Ar/N2 mixed atmospheres of various partial pressure ratios (PN/Ar), and then employs four-point probe, X-ray diffraction...

Full description

Bibliographic Details
Main Authors: Wei-Tong Liao, 廖為同
Other Authors: Giin-shan Chen
Format: Others
Language:zh-TW
Published: 2006
Online Access:http://ndltd.ncl.edu.tw/handle/64406878483895808680