Diagnosable Design of SoC Testing Architecture IEEE P1500
碩士 === 國立東華大學 === 資訊工程學系 === 94 === IEEE P1500 has been proposed as a standard and applied widely for system-on-chip (SoC) testing. However, in order to enhance the accuracy of SoC testing, IEEE P1500 must be tested and diagnosed before using it. This thesis analyzes the behaviors of IEEE P1500 and...
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| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/56858360201004541275 |