Study of optical recording marks and electrical measurement on ultrahigh density optical disc
碩士 === 國立臺灣海洋大學 === 光電科學研究所 === 94 === In this thesis, we use sandwich structure as ( ZnS-SiO2 / GeSbTe / ZnS-SiO2 ) and measure its Carrier to Noise Ratio ( CNR ). We can measure CNR under diffraction limit with high writing power and reading power . Then , we use C-AFM (Conductive - Atomic Force M...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30796534062675608495 |