The Hopfield Neural Networks for Automatic Semiconductor Wafer Defect Inspection
碩士 === 國立雲林科技大學 === 資訊工程研究所 === 94 === The occurrence of defect on a wafer may result in losing the yield ratio. The defective regions were usually identified through visual judgment with the aid of a scanning electron microscope. Dozens of people visually check wafers and hand-mark their defective...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2006
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| Online Access: | http://ndltd.ncl.edu.tw/handle/15621961912555308664 |