Fabrication of dual-metal gate oxide layer-HfTiOx with low temperature anodization to fabricate MIS capacitantor and high-k gate oxide MOSFET

碩士 === 國立雲林科技大學 === 電子與資訊工程研究所 === 94 === In this research, high-k oxide MIS capacitor and high-k gate oxide MOSFETs are prepared. First, we use RF sputtering system to deposit Hf and Ti metal on n-type ( 100 ) silicon substrate, and then used anodization to make the metal, both Hf and Ti , change i...

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Bibliographic Details
Main Authors: ChenguChi Su, 蘇承志
Other Authors: Hsueh-Tao Chou(周學韜)
Format: Others
Language:zh-TW
Published: 2005
Online Access:http://ndltd.ncl.edu.tw/handle/01983132553173139054